Return to List

Gathering at Shenzhen Nankai University, supporting the new development of electron microscopy - Ningbo Borui participated in the Guangdong Province Electron Microscope Society 2024 Annual Academic Conference.

2024-12-16


On December 15-16, 2024, the Guangdong Province Electron Microscope Society's 2024 Academic Annual Meeting will be held at Southern University of Science and Technology. Zhao Wenxia, the president of the Guangdong Province Electron Microscope Society, Professor Han Xiaodong, the president of the China Electron Microscope Society (International) and acting vice president of Southern University of Science and Technology, along with approximately 250 experts, scholars, and industry elites in related fields will attend the meeting.

This conference is hosted by the Guangdong Province Electron Microscope Society (Electronic Microscope Special Committee of Guangdong Province Analysis and Testing Association) and aims to promote the development of electron microanalysis technology in Guangdong Province, strengthen academic exchanges and cooperation among electron microanalysis workers, enhance independent innovation capabilities, improve the management and application level of electron microscopes, and jointly promote the transformation of scientific research achievements into practical applications, injecting new momentum into China's scientific and technological innovation development.

As a representative company with completely independent research and development and production of domestic electron microscopes, Ningbo Borui Si Electronic Beam Technology Co., Ltd. was invited to attend the conference and fully showcased its independently developed RAVIIS-300 rapid automatic micro-particle imaging analysis system and high-throughput (field emission) scanning electron microscope products in various application fields.

"Bringing semiconductor industrial-grade electron beam detection technology into the field of electron microscopy" is one of the purposes for which Dr. Fang Wei, founder, CEO, and CTO of Ningbo Borui Si, established the company. The launch of the new product RAVIIS-300 rapid automatic micro-particle imaging analysis system signifies a phased achievement of this goal.

The RAVIIS-300, independently developed, produced, and fully owned intellectual property product by Ningbo Borui Si, is the first single-beam field emission scanning transmission electron microscope in China. It achieves a high imaging speed of 2×100M/s, has both bright field and dark field channels, features fully automatic sample loading, and can perform continuous image acquisition for 24 hours a day over 7 days. In terms of resolution, RAVIIS-300 is positioned at 1nm. The 50kV electron gun not only reduces material costs but also minimizes sample loss, ensuring wide application of biological samples.

High-speed field emission scanning transmission (STEM) electron microscope RAVIIS-300

The great rejuvenation of the Chinese nation cannot be separated from the rapid development of national science and technology. In the future, Ningbo Borui Si will continue to focus on technology as its core, adhere to the path of independent innovation, remain true to its original aspiration, and contribute to the development of China's scientific research cause.