Product Features

1. Ultra High Resolution
Brand new optical system design, resolution 1.0nm@50kV (1nA), capable of obtaining images with both high resolution and large field of view (distortion less than 1‰).

2. Ultra High Speed Imaging
High-speed STEM detector, image acquisition speed 100M/S.

3. Fully Automatic Sample Loading and Navigation
Equipped with a fully automatic sample loading system (5 samples loaded simultaneously), a brand new sample loading scheme, and convenient sample information query function, achieving automation in sample management.

4. Stable and Reliable
24/7 automatic continuous image acquisition.

Core Technology

●High Resolution High Brightness Electron Optical System

100M/s ultra high-speed imaging at 50KV. The system has video-level (25fps@2k*2k) nanoscale analysis capability, allowing for fully automated information acquisition without omissions while maintaining high resolution.

●High Sensitivity Direct Electron Detector

All detectors of RAVIIS-300 use independently designed direct electron detectors, which convert electrons directly into electrical signals, achieving a detection efficiency of over 80% and a higher signal-to-noise ratio (SNR).

●Rapid Switching Between Large Field and High Resolution Imaging

Innovative electron optical design allows large field imaging and high resolution imaging to operate independently, enabling rapid switching, precise particle identification and positioning, and quick high-resolution imaging.

●High Speed and High Stability Mechanical Motion Platform

Uses a vibration-free motion platform, X=±4mm, Y=±4mm, positioning accuracy 1um.

●Optical System Designed for Fully Automated Micro Particle Detection

Traditional transmission electron microscopes have a small field of view, which cannot meet the detection and identification needs of a large number of nanoparticles. RAVIIS-300 is designed based on semiconductor industrial-grade electron beam detection equipment concepts, achieving high-throughput nanoparticle detection capabilities.
RAVIIS-300 achieves ultra high-speed imaging through innovative designs such as fast imaging technology, vibration-free sample stage, high-speed electron optical system, and AI technology, with imaging speeds reaching dozens of times that of traditional electron microscopes.

●Fully Automated Design

A series of actions such as power-on inspection, navigation positioning, one-click centering, focus adjustment, and shift correction are automated. The real-time focus tracking system is composed of hardware and software. Using precise electronic deflection to achieve accurate positioning of sample images, resulting in high repeatability of results. It not only eliminates the need for extensive effort to adjust and locate sample positions but also utilizes AI intelligence for automatic detection, ultimately achieving unattended continuous operation.

●Customizable Software Functions for Different Clients

Leveraging modern artificial intelligence, AI algorithms, etc., to assist experimental personnel in analysis, from front-end sample preparation to automatic full-section imaging and stitching by the electron microscope, generating high-resolution maps, and then to back-end data processing. AI intelligent analysis can be used for automatic detection and classification of particles, providing users with a complete solution.